Mrozek, Ireneusz
Multi-run Memory Tests for Pattern Sensitive Faults
Springer Cham, 2019
 eBooks
City of bits
 Buku Teks
Ryder, John D. (John Douglas)
Engineering electronics
McGraw-Hill, [date of publication not identified]
 Buku Teks
Dedy Rusmadi
Mengenal teknik digital
Sinar Baru , 1989
 Buku Teks
IEEE transactions on power electronics
The Institute of Electrical and Electronics Engineers, 2008
 Majalah, Jurnal, Buletin