Ditemukan 7 dokumen yang sesuai dengan query
Groenendijk, G.
Bandung: Bina Cipta, 1984
620.11 GRO mt
Buku Teks Universitas Indonesia Library
London: Taylor & Francis, 2003
617.605 DEN
Buku Teks Universitas Indonesia Library
"
Contents :
- Testing-Based Failure Analysis: A Critical Component of the SIA Roadmap Vision
- Experimental Figures for the Defect Coverage of IDDQVectors
- A CAD-Based Approach to Failure Diagnosis of CMOSLSI with Single Fault
Using Abnormal IDDQ
- Test and Failure Analysis Implications of a Novel Inter-Bit Dependency in a Non-
Volatile Memory
- Analysis of a Latent Deep Submicron CMOS Device Isolation Leakage
Mechanism
- ...
"
Materials Park, Ohio: ASM International, 1997
e20442506
eBooks Universitas Indonesia Library
"
Contents :
- Keynote Presentation
- Breakup Sequence of the TWA Flight 800 Airplane: How it was Determined That
an Explosion of the Wing Center Section Fuel Tank Initiated the Breakup
- Session 1: Advanced Techniques
- Micro-Raman Spectroscopy Evaluation of the Local Mechanical Stress in Shallow
Trench Isolation CMOS Structures: Correlation With Defect Generation and Diode
Leakage
- Microthermal Imaging Based on the Transmission Change ...
"
Materials Park, Ohio: ASM International, 1998
e20442507
eBooks Universitas Indonesia Library
"
Contents :
- Terahertz Imaging: A New Technique for Inspection of Dielectric Materials
- Detecting Power Shorts from Front and Backside of IC Packages Using Scanning
SQUID Microscopy
- Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing
- Optical Probing of VLSI IC’s from the Silicon Backside
- Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache
- Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated ...
"
Materials Park, Ohio: ASM International, 1999
e20442508
eBooks Universitas Indonesia Library
"
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results ...
"
Materials Park, Ohio: ASM International, 2008
e20442550
eBooks Universitas Indonesia Library
"
This book presents the research advances in the science of measurement, giving special focus to the field of machining and tribology. Topics such as dimensional metrology, precision measurements, industrial metrology, accuracy and precision in measurement are covered. Also theoretical aspects such as modelling and simulation are highlighted ...
"
Switzerland: Springer Nature, 2019
e20509209
eBooks Universitas Indonesia Library
