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Hasil Pencarian

Ditemukan 8 dokumen yang sesuai dengan query
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Soclof, Sidney
Englewood Cliffs, N.J.: Prentice-Hall, 1996
621.381 5 SOC d
Buku Teks  Universitas Indonesia Library
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Hamilton, T.D.S.
London: McGraw-Hill, 1977
R 621.381 5 HAM h
Buku Referensi  Universitas Indonesia Library
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Coughlin, Robert F.
New Jersey : Prentice-Hall, 2001
621.381 5 COU o
Buku Teks  Universitas Indonesia Library
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Sonde, B.S.
New Delhi: Wiley Eastern Limited, 1980
621.381 SON i (1)
Buku Teks  Universitas Indonesia Library
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Herpy, Miklos
Chichester, New York: Wiley , 1980
621.381 HER a (1)
Buku Teks  Universitas Indonesia Library
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Onabajo, Marvin
" This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power ... "
New York: [Springer, ], 2012
e20418288
eBooks  Universitas Indonesia Library
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" Analog circuit design contains the contribution of 18 tutorials of the 20th workshop on advances in analog circuit design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design ... "
Dordrecht, Netherlands: Springer, 2012
e20397889
eBooks  Universitas Indonesia Library
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" Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult ... "
London: Institution of Engineering and Technology, 2008
e20452172
eBooks  Universitas Indonesia Library