Ditemukan 2 dokumen yang sesuai dengan query
Tehranipoor, Mohammad
"
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise ...
"
New York: Springer, 2011
e20410831
eBooks Universitas Indonesia Library
Jayanthy, S.
"
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given ...
"
Singapore: Springer Singapore, 2019
e20502693
eBooks Universitas Indonesia Library
