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Hasil Pencarian

Ditemukan 2 dokumen yang sesuai dengan query
cover
Carr, Joseph J.
Boston: Newnes, 2002
R 621.384 CAR p
Buku Referensi  Universitas Indonesia Library
cover
Bou-Sleiman, Sleiman
" This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such ... "
New York: [Springer, ], 2012
e20397989
eBooks  Universitas Indonesia Library