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ISTFATM 2006: proceedings of the 32nd international symposium for testing and failure analysis, November 12-16, 2006 Renaissance Austin Hotel Austin, Texas, USA

ASM International (ASM International, 2006)

 Abstrak

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures.

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 ISTFATM 2006 proceedings of the 32nd international symposium for testing and failure analysis, November 12�16, 2006 renaissance austin hotel austin, texas, USA.pdf :: Unduh

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Jenis Koleksi : eBooks
No. Panggil : e20451852
Subjek :
Penerbitan : Materials Park, Ohio: ASM International, 2006
Sumber Pengatalogan : LibUI eng rda
Tipe Konten : text
Tipe Media : computer
Tipe Pembawa : online resource
Deskripsi Fisik : xx, 524 pages : illustration
Tautan : http://portal.igpublish.com/iglibrary/search/ASMIB0000102.main.html?14
Lembaga Pemilik :
Lokasi :
  • Ketersediaan
  • Ulasan
  • Sampul
No. Panggil No. Barkod Ketersediaan
e20451852 02-17-664807552 TERSEDIA
Ulasan:
Tidak ada ulasan pada koleksi ini: 20451852
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